1.

Conference Proceedings

Conference Proceedings
Briddon,P.R. ; Heggie,M.I. ; Jones,R.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.457-462,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Budde,M. ; Nielsen,B.Bech ; Leary,P. ; Goss,J. ; Jones,R. ; Briddon,P.R. ; Oberg,S. ; Breuer,S.J.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.35-40,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings

Conference Proceedings
Goss,J.P. ; Jones,R. ; Briddon,P.R. ; Oberg,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.775-780,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings

Conference Proceedings
Goss,J.P. ; Jones,R. ; Breuer,S.J. ; Briddon,P.R. ; Oberg,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.781-786,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings

Conference Proceedings
Jones,R. ; Torres,V.J.B. ; Briddon,P.R. ; Oberg,S.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.45-50,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
6.

Conference Proceedings

Conference Proceedings
Elsner,J. ; Jones,R. ; Sitch,P.K. ; Frauenheim,Th. ; Heggie,M.I. ; Oberg,S. ; Briddon,P.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1203-1210,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
7.

Conference Proceedings

Conference Proceedings
Resende,A. ; Goss,J. ; Briddon,P.R. ; Oberg,S. ; Jones,R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.295-300,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
8.

Conference Proceedings

Conference Proceedings
Hourahine,B. ; Jones,R. ; Oberg,S. ; Briddon,P.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.277-282,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
9.

Conference Proceedings

Conference Proceedings
Leary,P. ; Oberg,S. ; Briddon,P.R. ; Jones,R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.264-270,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
10.

Conference Proceedings

Conference Proceedings
Goss,J. ; Resende,A. ; Jones,R. ; Oberg,S. ; Briddon,P.R.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.67-72,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201