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Conference Proceedings
Conference Proceedings
1. THE BEHAVIOUR OF OXYGEN IN OXYGENATED N-TYPE HIGH-RESISTIVITY FLOAT-ZONE SILICON
Simoen, E. ; Claeys, C. ; Job, R. ; Ulyashin, A.G. ; Fahrner, W.R. ; Tonelli, G. ; Degryse, O. ; Clauws, P.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.912-924,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
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Conference Proceedings
Conference Proceedings
2. THE BEHAVIOUR OF OXYGEN IN OXYGENATED N-TYPE HIGH-RESISTIVITY FLOAT-ZONE SILICON
Simoen, E. ; Claeys, C. ; Job, R. ; Ulyashin, A.G. ; Fahrner, W.R. ; Tonelli, G. ; Degryse, O. ; Clauws, P.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.912-926,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
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Conference Proceedings
Conference Proceedings
3. Hydrogen Enhanced Thermal Donor Formation in p-Type Czochralski Silicon with a Denuded Zone
Ulyashin, U.G. ; Petlitskii, A.N. ; Job, R. ; Fahrner, W.R.
Pub. info.: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.211-220,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-13
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Conference Proceedings
Conference Proceedings
4. Direct Proof of Argon Atoms Incorporated Into High-Purity Silicon Single Crystals During Growth in Argon Gas Ambient
Ulyashin, A.G. ; Job, R. ; Fahrner, W.R. ; Mudryi, A.V. ; Patuk, Al. ; Shakin, I.A.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.66-76,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
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Conference Proceedings
Conference Proceedings
5. Bulk and Surface Properties of Cz Silicon After Hydrogen Plasma
Job, R. ; Ulyashin, AG. ; Fahrner, W.R. ; Markevich, V.P. ; Murin, LI. ; LindstrtSm, J.L. ; Raiko, V. ; Engemann, J.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.209-222,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
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Conference Proceedings
Conference Proceedings
6. A Two-Step Low-Temperature Process for p-n Junction Formation Due to Hydrogen-Enhanced Thermal Donor Formation in p-Type Czochralski Silicon
Job, R. ; Fahrner, W. R. ; Kazuchits, N. M. ; Ulyashin, A. G.
Pub. info.: Hydrogen in semiconductors and metals : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.337-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 513
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Conference Proceedings
Conference Proceedings
7. Oxygen Gettering and Thermal Donor Formation at Postimplantation Annealing of Hydrogen-Implanted Czochralski Silicon
Ulyashin, A. G. ; Bumay, Yu. A. ; Fahrner, W. R. ; Ivanov, A. I. ; Job, R. ; Palmetshofer, L.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.95-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
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Conference Proceedings
Conference Proceedings
8. The Conversion of Czochralski Silicon From p-Type to n-Type by Hydrogen Plasma-Enhanced Thermal Donor Formation
Job, R. ; Borchert, D. ; Bumay, Yu. A. ; Fahrner, W. R. ; Grabosch, G. ; Khorunzhii, I. A. ; Ulyashin, A. G.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.101-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
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Conference Proceedings
Conference Proceedings
9. Temperature Sensor on Boron Ion Implanted Diamond
Job, R. ; Denisenko, A. V. ; Zaitsev, A. M. ; Werner, M. ; Melnikov, A. A. ; Fahrner, W. R.
Pub. info.: Diamond for electronic applications.  pp.249-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 416
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Conference Proceedings
Conference Proceedings
10. Comparison of Oxygen and Hydrogen Gettering at High-Temperature Postimplantation Annealing of Hydrogen- and Helium-Implanted Czochralski Silicon
Job, R. ; Fahrner, W. R. ; Ivanov, A. I. ; Palmetshofer, L. ; Ulyashin, A. G.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.425-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
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Conference Proceedings
Conference Proceedings
11. Doping Of Oxidized Float Zone Silicon By Thermal Donors - A Low Thermal Budget Doping Method For Device Applications?
Job, R. ; Ulyashin, A.G. ; Huang, Y.L. ; Fahrner, W.R. ; Simoen, E. ; Claeys, C. ; Niedernostheide, F.-J. ; Schulze, H.-J. ; Tonelli, G.
Pub. info.: Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.257-262,  2002.  Warrendale, Pa.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 719
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Conference Proceedings
Conference Proceedings
12. Comparative Raman And Tem Analysis Of The Evolution Of Platelet Defects In Plasma Hydrogenated And Annealed Czochralski Silicon
Job, R. ; Beaufort, M.-F. ; Barbot, J.-F. ; Ulyashin, A.G. ; Fahrner, W.R.
Pub. info.: Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.217-222,  2002.  Warrendale, Pa.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 719
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Conference Proceedings
Conference Proceedings
13. Micro-Scale Physical and Chemical Heterogeneities in Biogenic Materials - A Combined Micro-Raman, Chemical Composition and Microhardness Indentation
Griesshaber, E. ; Job, R. ; Pettke, T. ; Schmahl, W. W.
Pub. info.: Mechanical properties of bioinspired and biological materials : symposium held November 29-December 2, 2004, Boston, Massachusetts, U.S.A..  pp.93-98,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 844
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Conference Proceedings
Conference Proceedings
14. Microstructure of Brachiopod Shells - an Inorganic/Organic Fiber Composite With Nanocrystalline Protective Layer
Griesshaber, E. ; Schmahl, W. ; Neuser, R. ; Job, R. ; Bluem, M. ; Brand, U.
Pub. info.: Mechanical properties of bioinspired and biological materials : symposium held November 29-December 2, 2004, Boston, Massachusetts, U.S.A..  pp.99-106,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 844
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Conference Proceedings
Conference Proceedings
15. Analysis of Oxygen Thermal Donor Formation in n-type Cz-Silicon
Rafi, J.M. ; Simoen, E. ; Claeys, C. ; Ulyashin, A. ; Job, R. ; Fahrner, W. ; Versluys, J. ; Clauws, P. ; Lozano, M. ; Campabadal, F.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.96-105,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
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Conference Proceedings
Conference Proceedings
16. Hydrogen-plasma-enhanced thermal donor formation in n-type high-resistivity MCZ silicon
Simoen, E. ; Huang, Y. L. ; Claeys, C. ; Raft, J. M. ; Job, R. ; Fahrner, W. R. ; Versluys, J. ; Clauws, P.
Pub. info.: Crystalline defects and contamination: their impact and control in device manufacturing IV : DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France.  pp.165-175,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-10
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Conference Proceedings
Conference Proceedings
17. Micro-Raman Analysis of Hydrogen Related Defects in Czochralski Silicon (Invited)
Job, R. ; Dungen, W. ; Ma, Y. ; Huang, Y. L.
Pub. info.: Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium.  pp.90-105,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-08
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Conference Proceedings
Conference Proceedings
18. Hydrogen Related Defects in Czochralski Silicon Close to the Wafer Surface: Defects Analysis and Technological Prospects (Tutorial)
Job, R.
Pub. info.: Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium.  pp.106-121,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-08
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Conference Proceedings
Conference Proceedings
19. A Low Temperature Technology on the Base of Hydrogen Enhanced Thermal Donor Formation for Future High-Voltage Applications
Job, R. ; Ulyashin, A.G. ; Fahrner, W.R. ; Niedernostheide, F.J. ; Schulze, H.J. ; Simoen, E. ; Claeys, C.L. ; Tonelli, G.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-1  pp.405-413,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
20.

Conference Proceedings
Conference Proceedings
20. Hydrogen Diffusion Characterized by Hydrogen Enhanced Thermal Donor Formation in p-Type Czochralski Silicon at Temperatures Between 350 and 450℃
Huang, Y.L. ; Ma, Y. ; Job, R. ; Fahmer, W.R.
Pub. info.: High purity silicon VIII : proceedings of the international symposium.  pp.419-428,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-05
21.

Conference Proceedings
Conference Proceedings
21. Thermal Evolution of Hydrogen Related Defects in Silicon Investigated by u-Raman Spectroscopy
Ma, Y. ; Huang, Y.L. ; Job, R. ; Fahrner, W.R. ; Beaufort, M.-F. ; Barbot, J. -F.
Pub. info.: High purity silicon VIII : proceedings of the international symposium.  pp.385-394,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-05
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Conference Proceedings
Conference Proceedings
22. Morphology and Stress Investigations of Surface and Subsurface Regions of Plasma Hydrogenated and Annealed Czochralski Silicon
Job, R. ; Ma, Y. ; Huang, Y.L. ; Diingen, W.
Pub. info.: High purity silicon VIII : proceedings of the international symposium.  pp.407-418,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-05
23.

Conference Proceedings
Conference Proceedings
23. μ-Raman Spectra Analysis of the Evolution of Hydrogen Related Defects and Void Formation in the Silicon Ion-Cut Process
Dungen, W. ; Job, R. ; Ma, Y. ; Huang, Y.L. ; Fahrner, W.R. ; Keller, L.O. ; Horstmann, J.T.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.503-508,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
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Conference Proceedings
Conference Proceedings
24. Void Formation in Hydrogen Implanted and Subsequently Plasma Hydrogenated and Annealed Czochralski Silicon
Job, R. ; Dungen, W. ; Ma, Y. ; Huang, Y.L. ; Horstmann, J.T.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.487-492,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
25.

Conference Proceedings
Conference Proceedings
25. On the Formation Kinetics of Thin Nanopatterned Layers on Silicon Wafers Created by Hydrogen Plasma Exposure
Job, R. ; Huang, Y. L. ; Ma, Y. ; Zolgert, B. ; Dungen, W.
Pub. info.: Kinetics-driven nanopatterning on surfaces : symposium held November 29-December 2, 2004, Boston, Massachusetts, U.S.A..  pp.103-108,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 849
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Conference Proceedings
Conference Proceedings
26. Control of Stress in Surface Engineered Silicon
Ma, Y. ; Job, R. ; Zolgert, B. ; Dungen, W. ; Huang, Y. L. ; Fahrner, W. R.
Pub. info.: Surface engineering 2004 - fundamentals and applications : symposium held November 30-December 2, 2004, Boston, Massachusetts, U.S.A..  pp.99-104,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 843
27.

Conference Proceedings
Conference Proceedings
27. Analysis of Oxygen Thermal Donor Formation in n-type Cz-Silicon
Raft, J.M. ; Simoen, E. ; Claeys, C. ; Ulyashin, A. ; Job, R. ; Fahrner, W. ; Versluys, J. ; Clauws, P. ; Lozano, M ; Campabadal, F.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.96-105,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3
28.

Conference Proceedings
Conference Proceedings
28. Structuring of Silicon Wafer Surfaces on the Sub-100 nm Scale by Hydrogen Plasma Treatments
Job, R. ; Ma, Y. ; Ulyashin, A. G.
Pub. info.: Continuous nanophase and nanostructured materials : symposium held December 1-5, 2003, Boston, Masachusetts, U.S.A..  pp.571-576,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 788
29.

Conference Proceedings
Conference Proceedings
29. P-N Junction Diodes Fabricated Based on Donor Formation in Plasma Hydrogenated P-Type Czochralski Silicon
Huang, Y.L. ; Simoen, E. ; Job, R. ; Claeys, C. ; Dungen, W. ; Ma, Y. ; Fahrner, W.R. ; Versluys, J. ; Clauws, P.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.307-312,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
30.

Conference Proceedings
Conference Proceedings
30. Low temperature Doping of Silicon by Hydrogen Plasma Treatments*
Job, R. ; Ulyashin, A.G. ; Ma, Y. ; Fahnwr, W.R. ; Simoen, E. ; Rafi, J.M. ; Claeys, C. ; Niedernostheide, F.J. ; Schulze, H.J.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.141-154,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20
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Conference Proceedings
Conference Proceedings
31. Luminescence Characterization and Application of Diamond
Zaitsev, A. M. ; Melnikov, A. A. ; Denisenko, A. V. ; Varichenko, V. S. ; Job, R. ; Fahrner, W. R.
Pub. info.: Diamond for electronic applications.  pp.113-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 416