Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado. pp.354-361, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado. pp.362-369, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
First International Symposium on Laser Precision Microfabrication : 14-16 June 2000, Omiya, Saitama, Japan. pp.240-243, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.125-128, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering