Blank Cover Image

Characterization of MOS-SOI structures by means of capacitance-voltage measurement analysis

Author(s):
Publication title:
Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-23
Pub. Year:
1997
Page(from):
197
Page(to):
202
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771764 [1566771765]
Language:
English
Call no.:
E23400/97-23
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Non-Equilibrium Related Effects in MOS-SOI Structures Capacitance-Voltage Measurements Analysis

Zareba,A., Ikraiam,F., Beck,R.B., Jakubowski,A.

Narosa Publishing House
7 Conference Proceedings Some Issues on Controlling the Morphology of the Pores Formed in Monocrystalline Silicon by Electrochemical Process

Domanski,K., Polrolnik,E., Beck,R.B., Jakubowski,A., Zak,J.K.

Narosa Publishing House
2 Conference Proceedings Measurement and Modelling of SOI MOSFETs Capacitances

Tomaszewski, D., Lukasiak, L., Gibki, J., Domanski, K., Jakubowski, A., Zareba, A.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Capacitance-Voltage Profiling of Multilayer Semiconductor Structures

Rimmer S. J., Hamilton B., Peaker R. A.

Plenum Press
3 Conference Proceedings Characterization of SiC MOS Structures Using Conductance Spectroscopy and Capacitance Voltage Analysis

Sveinbjornsson, E. O., Ahnoff, M., Olafsson, H. O.

Trans Tech Publications
9 Conference Proceedings Capacitance-Voltage Characteristics of p-Si/SiGeC MOS Capacitors

Rim, Kern, Takagi, S., Welser, J. J., Hoyt, J. L., Gibbons, J. F.

MRS - Materials Research Society
4 Conference Proceedings Very Thin (

Beck, R.B., Cuch, M., Wojtkiewicz, A., Kudla, A., Jakubowski, A.

Electrochemical Society
10 Conference Proceedings Silicon Piezoresistive Cantilever Beam with Porous Silicon Element

Domanski, K., Tomaszewski, D., Grabiec, P., Gniazdowski, Z., Kudla, A., Beck, R.B., Jakubowski, A., Gotszalk, T., …

SPIE-The International Society for Optical Engineering
5 Conference Proceedings CAPACITANCE-VOLTAGE CHARACTERISTICS OF METALLIC GATE/OXIDE/a-Si:H MOS STRUCTURES

Schropp, Ruud E.I., Snijder, Jan, Verwey, Jan F

Materials Research Society
11 Conference Proceedings Modelling and Characterization of SOI Devices

Andrzej Jakubowski, Malgorzata Jurczak, Lukasiak Lidia

Narosa Publishing House
6 Conference Proceedings DC and AC models of partially-depleted SOI MOSFETs in weak inversion

Tomaszewski, D., Domanski, K., Lukasiak, L., Zareba, A., Gibki, J., Jakubowski, A.

Kluwer Academic Publishers
12 Conference Proceedings Analysis of the Capacitance vs. Voltage in Graded Channel SOI Capacitor

Sonnenberg, V., Martino, J.A.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12