1.

Conference Proceedings
Conference Proceedings
1. Synthesis of Pd-Sn Nanoparticles by Using Ultrasonic Irradiation and their Electrocatalytic Activity for Oxygen Reduction
J. Kim ; J. Park ; T. Momma ; T. Osaka
Pub. info.: Nanomaterials for Energy Conversion and Storage.  pp.51-60,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 11(31)
2.

Conference Proceedings
Conference Proceedings
2. Development of 1 kW Class SOFC System at KEPRI
T. Lee ; J. Park ; J. Oh ; Y. Yoo ; J. Bae ; J. Kim
Pub. info.: Solid oxide fuel cells 10 (SOFC-X).  pp.199-204,  2007.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 7(1)
3.

Conference Proceedings
Conference Proceedings
3. High Density Inductively Coupled Plasma Etching of Zinc-Oxide(ZnO) and Indium-Zinc Oxide(IZO)
W. Lim ; L. Stafford ; B. Gila ; D. Norton ; S. Pearton ; F. Ren ; J. Song ; J. Park ; Y. Heo ; J. Lee ; J. Kim
Pub. info.: State-of-the-art program on compound semiconductors 46 (SOTAPOCS 46) and processes at the semiconductor/solution interface 2.  pp.239-248,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(2)
4.

Technical Paper
Technical Paper
4. Test and Performance Evaluation of Small Liquid-Monopropellant Rocket Engines
J. Kim ; J. Park ; S. Kim ; K. Jang
Pub. info.: AIAA meeting papers on disc.  2006.  Reston, Va.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 2006
5.

Conference Proceedings
Conference Proceedings
5. High-resolution in-die metrology using beam profile reflectometry and ellipsometry
C. Jun ; J. Park ; J. Opsal ; H. Pois ; I. Kim ; J. Kim ; L. Nicolaides
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
6.

Conference Proceedings
Conference Proceedings
6. Photoresist adhesion effect of resist reflow process
J. Park ; J. Lee ; M. Kim ; J. Kim ; S. Lee ; J. Park ; C. Bok ; S. Moon ; S. Park ; J. Hong ; H. Oh
Pub. info.: Advances in resist materials and processing technology XXIV.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6519
7.

Conference Proceedings
Conference Proceedings
7. Issues and challenges of double patterning lithography in DRAM
S. Kim ; S. Koo ; J. Choi ; Y. Hwang ; J. Park ; E. Kang ; C. Lim ; S. Moon ; J. Kim
Pub. info.: Optical microlithography XX.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6520
8.

Conference Proceedings
Conference Proceedings
8. Hyper NA polarized imaging of 45nm DRAM
C. Lim ; S. Park ; Y. Hyun ; J. Kim ; T. Eom ; J. Park ; S. Moon
Pub. info.: Optical microlithography XX.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6520
9.

Conference Proceedings
Conference Proceedings
9. Real-time damage monitoring scheme in PSC girder bridge using output-only acceleration data
J. Kim ; J. Park ; H. Do ; J. Lee
Pub. info.: Sensors and smart structures, technologies for civil, mechanical, and aerospace systems.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6529
10.

Conference Proceedings
Conference Proceedings
10. Monitoring cracks and prestress-loss in PSC girder bridges using vibration-based damage detection techniques
J. Park ; J. Kim ; Y. Ryu ; J. Lee
Pub. info.: Health monitoring of structural and biological systems 2007 : 19-22 March 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6532