1.

Conference Proceedings
Conference Proceedings
1. Surface Voltage and μPCD Mapping of Defect in Epitaxial SiC
M. Wilson ; A. Savtchouk ; A. Findlay ; J. Lagowski ; P. Edelman
Pub. info.: Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy.  pp.353-356,  2016.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 858
2.

Conference Proceedings
Conference Proceedings
2. The Present Status and Recent Advancements in Corona-Kelvin Non-Contact Electrical Metrology of Dielectrics for IC-Manufacturing
M. Wilson ; D. Marinskiy ; A. Byelyayev ; J. D'Amico ; A. Findlay ; L. Jastrzebski ; J. Lagowski
Pub. info.: Physics and technology of high-k gate dielectrics 4.  pp.3-24,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(3)