Electrostatic discharge/electrical overstress susceptibility in MEMS: a new failure mode
- Author(s):
Walraven,J.A. Soden,J.M. Tanner,D.M. Tangyunyong,P. Cole Jr.,E.I. Anderson,R.E. Irwin,L.W. - Publication title:
- MEMS Reliability for Critical Applications
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4180
- Pub. Year:
- 2000
- Page(from):
- 30
- Page(to):
- 39
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438362 [0819438367]
- Language:
- English
- Call no.:
- P63600/4180
- Type:
- Conference Proceedings
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