Advanced structural and functional materials design : proceedings of the International Symposium on Advanced Structural and Functional Materials Design, Osaka, Japan, November 10th-12th, 2004. pp.337-342, 2006. Switzerland. Trans Tech Publications
Ikeda, T. ; Higuchi, H. ; Ohkura, Y. ; Wakahara, S.
Pub. info.:
Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices. pp.251-258, 1997. Pennington, NJ. Electrochemical Society
Proceedings of the fifth International Symposium on Redox Mechanisms and Interfacial Properties of Molecules of Biological Importance 1993. pp.384-395, 1993. Pennington, NJ. Electrochemical Society
Popescu, G. ; Ikeda, T. ; Badizadegan, K. ; Dasari, R.R. ; Feld, M.S.
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Novel optical instrumentation for biomedical applications II : 12-16 June 2005, Munich, Germany. pp.58640B-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2004 : modeling, signal processing, and control : 15-18 March 2004, San Diego, California, USA. pp.112-121, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yamada, K. ; Morisita, S. ; Kutsuna, M. ; Ikeda, T.
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First International Symposium on High-Power Laser Macroprocessing : 27-31 May 2002, Osaka, Japan. pp.65-70, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ganguly, G. ; Ikeda, T. ; Sakata, I. ; Matsuda, A. ; Kato, K. ; Iizuka, S. ; Sato, N.
Pub. info.:
Amorphous silicon technology, 1996 : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.347-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Ikeda, T. ; Almazouzi, A. ; Funao, A. ; Numakura, H. ; Koiwa, M. ; Shirai, Y. ; Nonaka, K. ; Sprengel, W. ; Nakajima, H.
Pub. info.:
Diffusion mechanisms in crystalline materials : symposium held April 13-16, 1998, San Francisco, California, U.S.A.. pp.179-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Yamamoto, T. ; Yoneyama, S. ; Hasegawa, M. ; Kanazawa, A. ; Shiono, T. ; Ikeda, T.
Pub. info.:
Liquid crystal materials and devices : symposium held April 5-7, 1999, San Francisco, California, U.S.A.. pp.153-, 1999. Warrendale, PA. MRS - Materials Research Society
Liquid crystal materials and devices : symposium held April 5-7, 1999, San Francisco, California, U.S.A.. pp.201-, 1999. Warrendale, PA. MRS - Materials Research Society
Liquid crystals for advanced technologies : symposium held April 8-11, San Francisco, California, U.S.A.. pp.213-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Nose, Y. ; Ikeda, T. ; Nakajima, H. ; Tanaka, K. ; Numakura, H.
Pub. info.:
Defect properties and related phenomena in intermetallic alloys : symposium held December 3-5, 2002, Boston, Massachusetts, U.S.A.. pp.381-386, 2003. Warrendale, Pa.. Materials Research Society
Smart structures and materials 2005 : Modeling, signal processing, and control : 7-9 March 2005, San Diego, California, USA. pp.344-352, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Science and technology in catalysis 2002 : proceedings of the Fourth Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 14-19, 2002. pp.129-132, 2003. Amsterdam. Elsevier
Hirano, Y. ; Ipposhi, T. ; Thai, D. H. ; Iwamatsu, T. ; Ikeda, T. ; Tsujiuchi, M. ; Maegawa, S. ; Inuishi, M. ; Ohji, Y.
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Dielectrics for nanosystems: materials science, processing, reliability, and manufacturing : proceedings of the First international symposium. pp.60-64, 2004. Pennington, N.J.. Electrochemical Society
Kiyozumi, Y. ; Mizukami, F. ; Akiyama, Y. ; Ikeda, T. ; Nishide, T.
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Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001. pp.191-191, 2001. Amsterdam. Elsevier
Smart structures and materials 2003 : Modeling, signal processing, and control :3-6 March 2003, San Diego, California, USA, Ralph C. Smith, chairs/editors ; Sponsored by SPIE--The International Society for Optical Engineering. pp.35-45, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001. pp.300-300, 2001. Amsterdam. Elsevier
Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001. pp.362-362, 2001. Amsterdam. Elsevier
EPDIC 6 : proceedings of the sixth European Powder Diffraction Conference, held August 22-25, 1998 in Budapest, Hungary. pp.198-205, 2000. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Izumi, F. ; Kumazawa, S. ; Ikeda, T. ; Hu, W.-Z. ; Yamamoto, A. ; Oikawa, K.
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EPDIC 7 : proceedings of the seventh European Powder Diffraction Conference, held May 20-23, 2000 in Barcelona, Spain. pp.59-64, 2001. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Clark, K. J. ; Ikeda, T. ; Impey, M. D. ; McEwen, T. ; White, M.
Pub. info.:
Scientific basis for nuclear waste management XX : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.1125-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003. pp.661-664, 2004. Zuerich. Trans Tech Publications
Ikeda, T. ; Watanabe, K ; Yamaguchi, H ; Nishizawa, H. ; Tamba, N. ; Usami, M. ; Natsuaki, N.
Pub. info.:
Proceedings of the Third International Symposium on Semiconductor Wafer Bonding : physics and applications. pp.390-399, 1995. Pennington, NJ. Electrochemical Society
Oikawa, K. ; Kamiyama, T. ; Kanno, R. ; Izumi, F. ; Ikeda, T. ; Chakoumakos, B.C.
Pub. info.:
EPDIC 8 : proceedings of the eighth European Powder Diffraction Conference, held May 23-26, 2002 in Uppsala, Sweden. pp.337-340, 2004. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Uenishi, K. ; Seki, M. ; Kunimasa, T. ; Takatsugu, M. ; Kobayashi, K.F. ; Ikeda, T. ; Tsuboi, A.
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Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan. pp.57-62, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Richerzhagen, B. ; Kutsuna, M. ; Okada, H. ; Ikeda, T.
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Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan. pp.91-94, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Asano, M. ; Koike, T. ; Mikami, T. ; Abe, H. ; Ikeda, T. ; Tanaka, S. ; Mimotogi, S.
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Metrology, Inspection, and Process Control for Microlithography XIX. pp.9-18, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XX. pp.61521V-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ikeda, T. ; Kotani, T. ; Sato, T. ; Ueno, K. ; Matsuoka, R.
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Metrology, Inspection, and Process Control for Microlithography XVII. 2 pp.950-961, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.929-939, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yamanaka, E. ; Kanamitsu, S. ; Hirano, T. ; Tanaka, S. ; Ikeda, T. ; Ikenaga, O. ; Kawashima, T. ; Narukawa, S. ; Kobayashi, H.
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Photomask and Next-Generation Lithography Mask Technology XI. pp.257-264, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hashimoto, K. ; Fujise, H. ; Nojima, S. ; Ito, T. ; Ikeda, T.
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Photomask and Next-Generation Lithography Mask Technology XI. pp.471-480, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kariya, M. ; Yamanaka, E. ; Tanaka, S. ; Ikeda, T. ; Yamaguchi, S. ; Itoh, M. ; Kobayashi, H. ; Kawashima, T. ; Narukawa, S.
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Photomask and Next-Generation Lithography Mask Technology XII. pp.550-555, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering