A photomask defect evaluation system
- Author(s):
Yamanaka, E. ( Toshiba Corp. (Japan) ) Kanamitsu, S. ( Toshiba Corp. (Japan) ) Hirano, T. ( Toshiba Corp. (Japan) ) Tanaka, S. ( Toshiba Corp. (Japan) ) Ikeda, T. ( Toshiba Corp. (Japan) ) Ikenaga, O. ( Toshiba Corp. (Japan) ) Kawashima, T. ( Dai Nippon Printing Co., Ltd. (Japan) ) Narukawa, S. ( Dai Nippon Printing Co., Ltd. (Japan) ) Kobayashi, H. ( Dai Nippon Printing Co., Ltd. (Japan) ) - Publication title:
- Photomask and Next-Generation Lithography Mask Technology XI
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5446
- Pub. Year:
- 2004
- Page(from):
- 257
- Page(to):
- 264
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453693 [0819453692]
- Language:
- English
- Call no.:
- P63600/5446.1
- Type:
- Conference Proceedings
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