1.

Conference Proceedings
Conference Proceedings
1. Tunneling Current Through MIS Structures With Ultra-Thin Insulators
Fujioka, H. ; Wann, H-J. ; Park, D-G. ; King, Y-C. ; Chyan, Y-F. ; Oshima, M. ; Hu, C.
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.415-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428
2.

Conference Proceedings
Conference Proceedings
2. Characterization of MOS Structures with Ultra-Thin Tunneling Oxynitride
Fujioka, H. ; Wann, C. ; Park, D. ; Hu, C.
Pub. info.: Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.333-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 405
3.

Conference Proceedings
Conference Proceedings
3. Structure and Numerical Simulation of Field Effect Solar Cell
Koinuma, H. ; Fujioka, H. ; Hu, C. ; Koida, T. ; Kawasaki, M.
Pub. info.: Thin films for photovoltaic and related device applications.  pp.95-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 426