1.

Conference Proceedings

Conference Proceedings
Hofmann,D.M. ; Meyer,B.K. ; Christmann,P. ; Wimbauer,T. ; Stadler,W. ; Nikolov,A. ; Scharmann,A. ; Hofstatter,A.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1673-1678,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings

Conference Proceedings
Hofmann,D.M. ; Christmann,P. ; Volm,D. ; Pressel,K. ; Pereira,L. ; Santos,L. ; Pereira,E.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.79-84,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201