Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium. pp.12-15, 2000. Pennington, N.J.. Electrochemical Society
Molter, M.I. ; Hegger, J. ; Habel, W.R. ; Hofmann, D. ; Gutmann, T. ; Basedau, F.
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Smart structures and materials 2002 : smart sensor technology and measurement systems : 18-19 March 2002, San Diego, USA. pp.253-258, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Crail, S. ; Reichel, D. ; Schreiner, U. ; Lindner, E. ; Habel, W.R. ; Hofmann, D. ; Basedau, F. ; Brandes, K. ; Barner, A. ; Ecke, W. ; Schroeder, K.
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Smart structures and materials 2002 : smart sensor technology and measurement systems : 18-19 March 2002, San Diego, USA. pp.259-264, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Habel, W.R. ; Hofmann, D. ; Kohlhoff, H. ; Knapp, J. ; Brandes, K. ; Haenichen, H. ; Inaudi, D.
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Smart structures and materials 2002 : smart sensor technology and measurement systems : 18-19 March 2002, San Diego, USA. pp.236-241, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hofmann, D. ; Eckstein, R. ; Kadinski, L. ; Kolbl, M. ; Muller, M. ; Muller, St. G. ; Schmitt, E. ; Weber, A. ; Winnacker, A.
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Power semiconductor materials and devices : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.. pp.301-, 1998. Warrendale, Penn.. MRS - Materials Research Society
Eckstein, R. ; Hofmann, D. ; Makarov, Y. ; Muller, St. G. ; Pensl, G. ; Schmitt, E. ; Winnacker, A.
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III-Nitride, SiC, and Diamond Materials for Electronic Devices : symposium held April, 1996, San Francisco, California, U.S.A.. pp.215-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Kleint, C. A. ; Heinrich, A. ; Griessmann, H. ; Hofmann, D. ; Vinzelberg, H. ; Schumann, J. ; Schlaefer, D. ; Behr, G. ; Ivanenko, L.
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Thermoelectric materials, 1998--the next generation materials for small-scale refrigeration and power generation applications : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.. pp.165-, 1999. Warrendale, PA. MRS - Materials Research Society
Hofmann, D. ; Basedau, F. ; Habel, W. R. ; Gloetzl, R.
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Second European Workshop on Optical Fibre Sensors : EWOFS '04 : 9-11 June 2004, Santander, Spain. pp.128-131, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Gloetzl, R. ; Hofmann, D. ; Basedau, F. ; Habel, W.
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Smart structures and materials 2005 : Smart sensor technology and measurement systems : 7-9 March 2005, San Diego, California, USA. pp.248-253, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Lebid, S.Y. ; Hofmann, D. ; Basedau, F. ; Daum, W.
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Photonics, devices, and systems II :Proceedings from PHOTONICS PRAGUE 2002, 26-29 May 2002, Prague, Czech Republic, Miroslav Hrabovský, Dagmar Senderáková, Pavel Tománek, chairs/editors ; Organized by CSSF--Czech and Slovak Society for Photonics, Tech-Market. pp.366-371, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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