Spaeth, J. -M. ; Gorger, A. ; Hofmann, D. M. ; Meyer, B. K.
Pub. info.:
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.363-374, 1988. Pittsburgh, Pa.. Materials Research Society
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.185-194, 1985. Pittsburgh, Pa.. Materials Research Society
Wimbauer, T. ; Hofmann, D. M. ; Meyer, B. K. ; Brandt, M. S. ; Brandl, T. ; Bayerl, M. W. ; Reinacher, N. M. ; Stutzmann, M. ; Mochizuki, Y. ; Mizuta, M.
Pub. info.:
Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.511-, 1997. Pittsburgh, Penn. MRS - Materials Research Society
Emanuelsson, P. ; Drechsler, M. ; Hofmann, D. M. ; Meyer, B. K. ; Moser, M. ; Scholz, F.
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Growth, processing, and characterization of semiconductor heterostructures : Symposium held November 29-December 2, 1993, Massachusetts, U.S.A.. pp.543-, 1994. Pittsburgh. MRS - Materials Research Society
Meyer, B. K. ; Hofmann, D. M. ; Christmann, P. ; Stadler, W. ; Nikolov, A. ; Scharmann, A. ; Hofstaetter, A.
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Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A.. pp.453-, 1995. Pittsburgh, Pa.. MRS - Materials Research Society
Meyer, B. K. ; Hofmann, D. M. ; Stadler, W. ; Emanuelsson, P. ; Omling, P. ; Weigel, E. ; Muller-Vogt, G. ; Wienecke, F. ; Schenk, M.
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Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.. pp.433-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society
Hofmann, D. M. ; Kovalev, D. ; Steude, G. ; Volm, D. ; Meyer, B. K. ; Xavier, C. ; Monteiro, T. ; Pereira, E. ; Mokov, E. N. ; Amano, H. ; Akasaki, I.
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Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.619-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Steude, G. ; Hofmann, D. M. ; Drechsler, M. ; Meyer, B. K. ; Hardtdegen, H. ; Hollfelder, M.
Pub. info.:
Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.399-, 1997. Pittsburgh, Penn. MRS - Materials Research Society
Meyer, B. K. ; Hofmann, D. M. ; Volm, D. ; Chen, W. M. ; Son, N. T. ; Janzen, E.
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Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999. pp.559-562, 2000. Zuerich, Switzerland. Trans Tech Publications
Meyer, B. K. ; Hofmann, D. M. ; Stadler, W. ; Salk, M. ; Eiche, C. ; Benz, K. W.
Pub. info.:
Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.. pp.189-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society