1.

Conference Proceedings
Conference Proceedings
1. A multifunctional phase-shifted interferometer with small dimension
Gao, Z. ; Zhu, R. ; Chen, L. ; Wang, Q. ; He, Y. ; Ji, H.
Pub. info.: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.205-209,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5638
2.

Conference Proceedings
Conference Proceedings
2. Gauge block parameter measurement through static interferogram using virtual grating moire technique
Chen, L. ; He, Y. ; Liu, F. ; Su, J. ; Yin, Y.
Pub. info.: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.424-427,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5638
3.

Conference Proceedings
Conference Proceedings
3. The position relationship in multi-interferograms
Wang, W. ; Wang, Q. ; He, Y. ; Chen, L.
Pub. info.: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.878-882,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5638
4.

Conference Proceedings
Conference Proceedings
4. Surface roughness measurement using infrared phase-shifting digital interferometer
He, Y. ; Chen, L. ; Wang, Q. ; Chen, J.B.
Pub. info.: Optical design and testing : 15-18 October 2002, Shanghai, China.  pp.170-176,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4927
5.

Conference Proceedings
Conference Proceedings
5. Adaptive vibration-resistant techniques in interferometry based on single-point phasedetecting [6150-100]
He, Y. ; Chen, L. ; Zhang, X.
Pub. info.: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  pp.61504E-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6150
6.

Conference Proceedings
Conference Proceedings
6. Bringing OAM to carrier-class EPON system
Zhang, A. ; He, Y. ; Chen, L. ; Zhu, L.
Pub. info.: Network Architectures, Management, and Applications II.  pp.177-185,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5626