OFS-13 : 13th International Conference on Optical Fiber Sensors & Workshop on Device and System Technology toward Future Optical Fiber Communication and Sensing : April 12-16, 1999, Kyongju Hyundai Hotel, Kyongju, Korea. pp.337-340, 1999. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sugisaki, K. ; Okada, M. ; Zhu, Y. ; Otaki, K. ; Liu, Z. ; Kawakami, J. ; Ishii, M. ; Saito, J. ; Murakami, K. ; Hasegawa, M. ; Ouchi, C. ; Kato, S. ; Hasegawa, T. ; Suzuki, K. ; Yokota, H. ; Niibe, M. ; Takeda, M.
Pub. info.:
Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA. pp.59210D-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Klshio, K. ; Hasegawa, T. ; Suzuki, K. ; Kitazawa, K. ; Fueki, K.
Pub. info.:
High temperature superconductors : relationships between properties, structure, and solid-state chemistry. pp.91-98, 1989. Pittsburgh, Pa.. Materials Research Society
Hasegawa, T. ; Kobayashi, T. ; Kadomura, S. ; Aoyama, J.
Pub. info.:
Amorphous and crystalline insulating thin films--1996 : symposium held December 2-4, 1996, Boston, Massachusetts, U.S.A.. pp.227-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Zhao, X.R. ; Okazaki, N. ; Konishi, Y. ; Akahane, K. ; Kuang, Z. ; Ishibashi, T. ; Sato, K. ; Koinuma, H. ; Hasegawa, T.
Pub. info.:
Combinatorial and artificial intelligence methods in materials science II : symposium held December 1-4, Boston, Massachusetts, U.S.A. pp.241-248, 2004. Warrendale, Pa.. Materials Research Society
THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain. pp.369-374, 2003. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Proceedings of the International Conference on Colloid and Surface Science, Tokyo, Japan, November 5-8, 2000 : 25th Anniversary of the Division of Colloid and Surface Chemistry, the Chemical Society of Japan. pp.865-868, 2001. Amsterdam. Elsevier
Kawara, K. ; Taniguchi, Y. ; Sato, Y. ; Okuda, H. ; Matsumoto, T. ; Sofue, Y. ; Wakamatsu, K. ; Matsuhara, H. ; Hasegawa, T. ; Chambers, K.C. ; Cowie, L.L. ; Joseph, R.D. ; Sanders, D.B. ; Wynn-Williams, C.G.
Pub. info.:
The far infrared and submillimetre universe : an ESA symposium devoted to the Far InfraRed and Submillimetre Telescope (FIRST) mission : 15-17 April 1997, Institut de Radio Astronomie Millimétrique (IRAM), Grenoble, France. pp.285-288, 1997. Noordwijk, The Netherlands. ESA Publications Division
Kitazawa, K. ; Kishiio, K. ; Hasegawa, T. ; Ohtomo, A. ; Yaegashi, S. ; Kanbe, S. ; Park, K. ; Kuwahara, K. ; Fueki, K.
Pub. info.:
High-temperature superconductors : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.. pp.33-40, 1988. Pittsburgh, Pa.. Materials Research Society
Proceedings of the International Conference on Colloid and Surface Science, Tokyo, Japan, November 5-8, 2000 : 25th Anniversary of the Division of Colloid and Surface Chemistry, the Chemical Society of Japan. pp.465-468, 2001. Amsterdam. Elsevier
Towards innovation in superplasticity II : proceedings of the 2nd International Conference "Towards Innovation in Superplasticity", held in Kobe City, Japan, September 1998. pp.249-254, 1999. Tuerich, Switzerland. Trans Tech Publications
Hasegawa, M. ; Ouchi, C. ; Hasegawa, T. ; Kato, S. ; Ohkubo, A. ; Suzuki, A. ; Sugisaki, K. ; Okada, M. ; Otaki, K. ; Murakami, K. ; Saito, J. ; Niibe, M. ; Takeda, M.
Pub. info.:
Advances in mirror technology for X-ray, EUV lithography, laser, and other applications II : 5 August 2004, Denver, Colorado, USA. pp.27-36, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fan, X.J. ; Murakami, M. ; Takahasi, R. ; Koida, T. ; Matsumoto, Y. ; Hasegawa, T. ; Fukumura, T. ; Kawasaki, M. ; Ahmet, P. ; Chikyow, T. ; Koinuma, H.
Pub. info.:
Combinatorial and artificial intelligence methods in materials science : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A. pp.55-60, 2002. Warrendale, Pa.. Materials Research Society
Ueno, K. ; Ohkubo, I. ; Matsumoto, Y. ; Okazaki, N. ; Hasegawa, T. ; Itaka, K. ; Koinuma, H.
Pub. info.:
Combinatorial and artificial intelligence methods in materials science : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A. pp.67-74, 2002. Warrendale, Pa.. Materials Research Society
Fukumura, T. ; Kawasaki, M. ; Jin, Zhengwu ; Kimura, H. ; Yamada, Y. ; Haemori, M. ; Matsumoto, Y. ; Inaba, K. ; Murakami, M. ; Takahashi, R. ; Hasegawa, T. ; Koinuma, H.
Pub. info.:
Combinatorial and artificial intelligence methods in materials science : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A. pp.45-54, 2002. Warrendale, Pa.. Materials Research Society
Chikyow, T. ; Ahmet, P. ; Naruke, T. ; Nakajima, K. ; Okazaki, N. ; Hasegawa, K. ; Minami, H. ; Itaka, K. ; Koida, T. ; Song, J.H. ; Yoshimoto, M. ; Hasegawa, T. ; Kawasaki, M. ; Koinuma, H.
Pub. info.:
Combinatorial and artificial intelligence methods in materials science : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A. pp.85-96, 2002. Warrendale, Pa.. Materials Research Society
Ohkubo, I. ; Matsumoto, Y. ; Ohtani, M. ; Hasegawa, T. ; Ueno, K. ; Itaka, K. ; Parhat, A. ; Kawasaki, M. ; Koinuma, H.
Pub. info.:
Combinatorial and artificial intelligence methods in materials science : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A. pp.61-66, 2002. Warrendale, Pa.. Materials Research Society
Murakami, K. ; Saito, J. ; Ota, K. ; Kondo, H. ; Ishii, M. ; Kawakami, J. ; Oshino, T. ; Sugisaki, K. ; Zhu, Y. ; Hasegawa, M. ; Sekine, Y. ; Takeuchi, S. ; Ouchi, C. ; Kakuchi, O. ; Watanabe, Y. ; Hasegawa, T. ; Hara, S. ; Suzuki, A.
Pub. info.:
Emerging Lithographic Technologies VII. 1 pp.257-264, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ouchi, C. ; Kato, S. ; Hasegawa, M. ; Hasegawa, T. ; Yokota, H. ; Sugisaki, K. ; Okada, M. ; Murakami, K. ; Saito, J. ; Nilbe, M. ; Takeda, M.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XX. pp.61522O-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering