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19 results

Conference Proceedings

1. Hydroelastic Response Simulation of a VLFS in Irregular Waves Considering Taking-Off and Landing Impact

H. Shin ; H. Y. Lee ; C. G. Lim ; H. S. Shin ; I. K. Park

Pub. info.:	Ocean space utilization : presented at the 20th International Conference on Offshore Mechanics and Arctic Engineering, June 3-8, 2001, Rio de Janeiro, Brazil. 5 pp.291-296, 2001. New York. American Society of Mechanical Engineers
Title of ser.:	ASME Symposia Volumes
Ser. no.:	OMAE 20(5)

Conference Proceedings

2. Hydroelastic Responses of a Very Large Floating Structure With a Breakwater

H. Y. Lee ; H. Shin ; C. G. Lim ; O. H. Kim ; J. M. Kang

Pub. info.:	Ocean space utilization : presented at the 20th International Conference on Offshore Mechanics and Arctic Engineering, June 3-8, 2001, Rio de Janeiro, Brazil. 5 pp.297-304, 2001. New York. American Society of Mechanical Engineers
Title of ser.:	ASME Symposia Volumes
Ser. no.:	OMAE 20(5)

Conference Proceedings

3. A Study on Hydroelastic Responses of a Very Large Box-Shaped Floating Structure With Shallow Draft

H. Shin ; S. K. Kim ; Y. S. Yang ; I. K. Park ; H. S. Shin

Pub. info.:	Ocean space utilization : presented at the 18th International Conference on Offshore Mechanics and Arctic Engineering, July 11-16, 1999, St. John's, Newfoundland, Canada. 6 pp.9-16, 1999. New York. American Society of Mechanical Engineers
Title of ser.:	ASME Symposia Volumes
Ser. no.:	OMAE 18(6)

Conference Proceedings

4. Reliability of High Performance Short Channel Polycrystalline Silicon Thin Film Transistor on the Glass Substrate

H. Shin ; I. Song ; J. Park ; M. Han

Pub. info.:	2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT). pp.249-254, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	8(1)

Conference Proceedings

5. Fabrication of Nanoscale Tubular Structures and Capsules of Oxides by ALD

C. Bae ; S. Kim ; H. Shin ; J. Kim

Pub. info.:	Atomic layer deposition applications 3. pp.149-154, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(7)

Conference Proceedings

6. The Characteristics of Hot-Carrier Stressed Bottom-Gate Polycrystalline Silicon Thin-Film Transistors Employing Alternating Magnetic-Field-Enhanced Rapid Thermal Annealing

W. Lee ; H. Shin ; K. Cho ; J. Choi ; C. Kim

Pub. info.:	Thin Film Transistors 9. pp.67-72, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(9)

Conference Proceedings

7. The Hysteresis Phenomenon in a-Si:H TFT and Poly-Si TFT in AMOLED

S. Park ; J. Lee ; H. Shin ; S. Choi ; M. Han

Pub. info.:	2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT). pp.77-82, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	8(1)

Conference Proceedings

8. Plasma-assisted cleaning by electrostatics (PACE)

W. M. Lytle ; H. Shin ; D. N. Ruzic

Pub. info.:	Metrology, inspection, and process control for microlithography XXI. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6518

Conference Proceedings

9. Size tolerance of sub-resolution assist features for sub-50-nm node device

B. Kim ; S. Lee ; H. Shin ; N. Lee

Pub. info.:	Optical microlithography XX. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6520

10.

Conference Proceedings

10. Contamination removal from collector optics and masks: an essential step for next-generation lithography

H. Shin ; S. N. Srivastava ; D. N. Ruzic

Pub. info.:	Metrology, inspection, and process control for microlithography XXI. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6518

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