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45 results

Conference Proceedings

1. MECHANISM OF Cr DIFFUSION IN GaAs

Yu, S. ; Tan, T. Y. ; Gosele, U.

Pub. info.:	Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.747-758, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	240

Conference Proceedings

2. DETERMINATION OF Ga SELF-DIFFUSION COEFFICIENT IN GaAs

Tan, T. Y. ; Yu, S. ; Gosele, U.

Pub. info.:	Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.739-746, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	240

Conference Proceedings

3. Highly Ordered Alumina Films: Pore Growth and Applications

Wehrspohn, R.B. ; Li, A.-P. ; Nielsch, K. ; Muller, F. ; Erfurth, W. ; Gosele, U.

Pub. info.:	Oxide Films : proceedings of the International Symposium. pp.271-282, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-4

Conference Proceedings

4. PORE FORMATION AND PROPAGATION MECHANISM IN POROUS SILICON

Lehmann, V. ; Cerva, H. ; Gosele, U.

Pub. info.:	Light emission from silicon : symposium held December 3-5, 1991, Boston, Massachusetts, U.S.A.. pp.3-6, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	256

Conference Proceedings

5. ENHANCED CARBON DIFFUSION IN SILICON DURING 900 C ANNEALING

Ladd, L. A. ; kalejs, J. P. ; Gosele, U.

Pub. info.:	Impurity diffusion and gettering in silicon : symposium held November 27-30, 1984, Boston, Massachusetts, U.S.A.. pp.89-94, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	36

Conference Proceedings

6. FORMATION MECHANISM OF MICROPOROUS SILICON: PREDICTIONS AND EXPERIMENTAL RESULTS

Lehmann, V. ; Gosele, U.

Pub. info.:	Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.27-32, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	283

Conference Proceedings

7. EFFECT OF CONCENTRATION GRADIENT ON PHASE STABILITY

Tu, K. N. ; Gosele, U.

Pub. info.:	Alloy phase diagrams : symposium held November 1982 in Boston, Massachusetts, U.S.A.. pp.375-376, 1983. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	19

Conference Proceedings

8. THERMAL DONOR FORMATION BY THE AGGLOMERATION OF OXYGEN IN SILICON

Gosele, U. ; Tan,. T. Y.

Pub. info.:	Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.. pp.153-158, 1983. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	14

Conference Proceedings

9. MECHANISMS OF DOPING-ENHANCED SUPERLATTICE DISORDERING AND OF GALLIUM SELF-DIFFUSION IN GaAs

Tan, T. Y. ; Gosele, U. ; Marioton, B. P. R.

Pub. info.:	Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.605-612, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	104

10.

Conference Proceedings

10. *Domain imaging, polarization hysteresis, and switching in nano-size ferroelectric structures

Harnagea, C. ; Pignolet, A. ; Alexe, M. ; Hesse, D. ; Gosele, U.

Pub. info.:	Ferroelectric thin films VIII : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.351-, 2000. Warrendale, PA. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	596

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