1.

Conference Proceedings
Conference Proceedings
1. Modeling of Incidental Contamination and Cleaning of Recycled PET
目次はDivisionごとに分けて掲載されている。論文の順番はDivisionにかかわらず，Session順の通しページになっている。
Pub. info.: Back to the future : conference proceedings : ANTEC 1992, Detroit, May 3-7.  pp.260-264,  1992.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 38
2.

Conference Proceedings
Conference Proceedings
2. Vanadium-free Semi-insulating 4H-SiC Substrates
Mitchel, W. C. ; Saxler, A. ; Perrin, R. ; Goldstein, J. ; Smith, S. R. ; Evwaraye, A. O. ; Solomon, J. S. ; Brady, M. ; Tsvetkov, V. ; Carter, C. H. Jr.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.21-24,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
3.

Conference Proceedings
Conference Proceedings
3. Characterization of Vanadium-doped 4H-SiC using optical admittance spectroscopy
Smith, S. R. ; Evwaraye, A. O. ; Mitchel, W. C. ; Solomon, J. S. ; Goldstein, J.
Pub. info.: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.253-,  1999.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 572
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Conference Proceedings
Conference Proceedings
4. Comparative studies on cervical and colonic malignancies using FTIR microspectroscopy
Mordechai, S. ; Mark, S. ; Podshyvalov, A. ; Kantarovich, K. ; Bernshtain, Y. ; Salman, A. ; Erukhimovitch, V. ; Guterman, H. ; Goldstein, J. ; Argov, S. ; Jagannathan, R.
Pub. info.: Smart Nondestructive Evaluation and Health Monitoring of Structural and Biological Systems II.  pp.369-377,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5047