1.

Conference Proceedings
Conference Proceedings
1. A New Bistable Shallow Thermal Donor in Al-Doped Si
Kaczor,P. ; Godlewski,M. ; Gregorkiewicz,T.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1185-1190,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings
Conference Proceedings
2. Optically detected cyclotron resonance studies of erbium and ytterbium doped InP
Godlewski,M. ; Liesert,B.J.HeijrDink ; Gregorkiewicz,T. ; Ammerlaan,C.A.J.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.683-688,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
3.

Conference Proceedings
Conference Proceedings
3. Interstitial and substitutional Mn in GaAs and GaP:magnetic resonance studies
Gisbergen,S.J.C.H.M.Van ; Ezhevskii,A.A. ; Godlewski,M. ; Gregorkiewicz,T. ; Ammerlaan,C.A.J.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.701-706,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87