Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A.. pp.403-408, 1989. Pittsburgh, Pa.. Materials Research Society
Batstone, J.L. ; White, Alice E. ; Short, K..T. ; Gibson, J.M. ; Jacobson, D.C.
Pub. info.:
Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A.. pp.597-602, 1987. Pittsburgh, Pa.. Materials Research Society
Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.163-170, 1985. Pittsburgh, Pa.. Materials Research Society
Materials issues in microcrystalline semiconductors : symposium held November 29-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.161-170, 1990. Pittsburgh, Pa.. Materials Research Society
Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A.. pp.179-184, 1990. Pittsburgh, Pa.. Materials Research Society
Beam-solid interactions and phase transformations : symposium held December 2-4, 1985, Boston, Massachusetts, USA. pp.389-394, 1985. Pittsburgh, Pa.. Materials Research Society
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.861-866, 1990. Pittsburgh, Pa.. Materials Research Society
Loretto, D. ; Gibson, J.M. ; White, Alice E. ; Short, K.T. ; Tung, R.T. ; Yalisove, S.M. ; Batstone, J.L.
Pub. info.:
High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.. pp.97-102, 1989. Pittsburgh, Pa.. Materials Research Society
Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA. pp.457-468, 1985. Pittsburgh, Pa.. Materials Research Society
High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.. pp.67-74, 1989. Pittsburgh, Pa.. Materials Research Society