1.

Conference Proceedings
Conference Proceedings
1. TDS and RBS Studies of Ar Implanted to Si
Hanada,R. ; Saito,S. ; Nagata,S. ; Yamaguchi,S. ; Shinozuka,T. ; Fujioka,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1375-1380,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. Perturbed Angular Correlation Study of Impurities Interaction in Si
Hanada,R. ; Shinozuka,T. ; Fujioka,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1369-1374,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201