1.

Conference Proceedings
Conference Proceedings
1. In-flight performance and calibration of the Chandra high-resolution camera spectroscopic readout(HRC-S)
Kraft,R.P. ; Chappell,J.H. ; Kenter,A.T. ; Meehan,G.R. ; Murray,S.S. ; Zombeck,M.V. ; Donnelly,R.H. ; Drake,J.J. ; Johnson,C.O. ; Juda,M. ; Patnaude,D. ; Pease,D.O. ; Ratzlaff,P.W. ; Wargelin,B.J. ; Austin,G.K. ; Fraser,G.W. ; Pearson,J.F. ; Lees,J.E. ; Brunton,A.N.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.493-517,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
2.

Conference Proceedings
Conference Proceedings
2. MCP-based x-ray collimators for lithography of semiconductor devices
Brunton,A.N. ; Lees,J.E. ; Fraser,G.W. ; Tremsin,A.S. ; Feller,W.B. ; White,P.L.
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.212-221,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805
3.

Conference Proceedings
Conference Proceedings
3. Characteristics of Photonis 6-μm pore microchannel Plates
Pearson,J.F. ; Brunton,A.N. ; Martin,A.P. ; Fraser,G.W. ; Lees,J.E. ; Boutot,J.P. ; Fairbend,R. ; Flyckt,S.O.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.217-228,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140
4.

Conference Proceedings
Conference Proceedings
4. Low-resistance conductively cooled microchannel plates
Tremsin,A.S. ; Pearson,J.F. ; Lees,J.E. ; Fraser,G.W. ; Feller,W.B. ; White,P.L.
Pub. info.: EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado.  pp.86-97,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2808
5.

Conference Proceedings
Conference Proceedings
5. Absolute quantum efficiency calibration of the AXAF High-Resolution Camera
Kraft,R.P. ; Chappell,J.H. ; Kenter,A.T. ; Kobayashi,K. ; Meehan,G.R. ; Murray,S.S. ; Zombeck,M.V. ; Fraser,G.W. ; Pearson,J.F. ; Lees,J.E. ; Brunton,A.N. ; Pearce,S.E.
Pub. info.: EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado.  pp.194-209,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2808