1.

Conference Proceedings
Conference Proceedings
1. Reduction of pass-gate leakage by silicon-thickness thinning in double-gate MOSFETs
Sakainoto, W. ; Endoh, T. ; Sakuraba, H. ; Masuoka, F.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.331-336,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
2.

Conference Proceedings
Conference Proceedings
2. Influence of Wafer Loading Atmosphere Upon Chemical Structure of Sub-Snm Oxide Films
Endoh, T. ; Kimura, Y. ; Lenski, M. ; Sakuraba, H. ; Masuoka, F.
Pub. info.: Semiconductor technology (ISTC 2001) : proceedings of the 1st International Conference on Semiconductor Technology.  pp.196-200,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-17