Total dose and single event effects irradiation of various commercial integrated circuits in logic families and line interfaces
- Author(s):
Malou, F. ( CNES, Toulouse, France ) Bezerra, F. ( CNES, Toulouse, France ) Salvaterra, G. ( Astrium, Velizy Villacoublay, France ) Chatry, C. ( TRAD, Labege, France ) Falo, W. ( TRAD, Labege, France ) David, J-P. ( ONERA, Toulouse, France ) Duzellier, S. ( ONERA, Toulouse, France ) - Publication title:
- Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France
- Title of ser.:
- ESA SP
- Ser. no.:
- 507
- Pub. Year:
- 2002
- Page(from):
- 387
- Page(to):
- 392
- Pages:
- 6
- Pub. info.:
- Noordwijk, The Netherlands: ESA Publications Division
- ISSN:
- 03796566
- ISBN:
- 9789290928171 [9290928174]
- Language:
- English
- Call no.:
- E11690/507
- Type:
- Conference Proceedings
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