Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.58781G-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Guo, X. ; Chen, M. ; Zhu, J. ; Ma, Y. ; Du, J. ; Guo, Y. ; Du, C.
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ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China. pp.60320K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Guo, X. ; Du, J. ; Chen, M. ; Ma, Y. ; Zhu, J. ; Peng, Q. ; Guo, Y. ; Du, C.
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Current developments in lens design and optical engineering VI : 2-4 August 2005, San Diego, California, USA. pp.58740S-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering