Blank Cover Image

A Correlation Study Of Thermal Stability On Porous Low-K

Author(s):
Chow, Y.F.
Foo, T.H.
Shen, L.
Pan, J.S.
Du, A. Y.
Xing, Z.X.
Yuan, Y.J.
Li, C.Y.
Kumar, R.
Foo, P.D.
5 more
Publication title:
Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
716
Pub. Year:
2002
Page(from):
563
Page(to):
568
Pages:
6
Pub. info.:
Warrendale: Materials Research Society
ISSN:
02729172
ISBN:
9781558996526 [1558996524]
Language:
English
Call no.:
M23500/716
Type:
Conference Proceedings

Similar Items:

Y.F. Pan, P.Z. Zhao, Y.F. Shen, X.J. Shi, T. Jiang

Trans Tech Publications

Li,C.Y., Zhang,D.H., Qian,Y., Narayanan,B., Wu,J.J., Yu,B., Jiang,Z.X., Foo,P.D., Xie,J., Zhang,Q., Yoon,S.F.

SPIE - The International Society for Optical Engineering

Y.F. Pan, P.Z. Zhao, Y.F. Shen, X.J. Shi, T. Jiang

Trans Tech Publications

Prasad, K., Yuan, X.L., Tan, C.M., Zhang, D.H., Li, C. Y., Wang, S.R., Yuan, S.Y.J., Xie, J.L., Gui, D., Foo, P.D.

Materials Research Society

Zhao, F.F., Shen, Z.X., Zheng, J.Z., Gao, W.Z., Osipowicz, T., Pang, C.H., Lee, P.S., See, A.K.

Materials Research Society

Q. Ma, Y.J. Wang, H.D. Zheng, C.Y. Ning, X.F. Chen

Trans Tech Publications

J.W. Yuan, K. Zhang, X.G. Li, T. Li, Y.J. Li

Trans Tech Publications

Yao, J.Y., Ding, G.F., Cao, Y., Yang, C.S., Shen, T.H.

SPIE-The International Society for Optical Engineering

S. Meng, Z.X. Hu, X.Y. Xing, Q.X. Lu, Z. Zhou

Trans Tech Publications

Liu,T.H., Jiang,Z.F., Li,W.Y., Liu,Z.J., Zhao,Y.J.

SPIE-The International Society for Optical Engineering

Li, X.H., Yuan, Q.L., Wang, D.N., Cao, Z.Q., Shen, Q.S.

SPIE-The International Society for Optical Engineering

D.X. Yang, Y.F. Sun

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12