1.

Conference Proceedings
Conference Proceedings
1. Imaging the microstructure of copper with the atomic force microscope (AFM) and ultrasonic force microscope (UFM)
Druffner, C.J. ; Schumaker, E.J. ; Murray, P.T. ; Sathish, S.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems.  pp.122-131,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5045
2.

Conference Proceedings
Conference Proceedings
2. Improving atomic force microscopy images with the adaptation of ultrasonic force microscopy
Druffner, C.J. ; Sathish, S.
Pub. info.: Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems.  pp.105-113,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4703
3.

Conference Proceedings
Conference Proceedings
3. High-resolution nondestructive evaluation at the Center for Materials Diagnosis
Meyendorf, N. ; Sathish, S. ; Druffner, C.J. ; Blackshire, J.L. ; Hoffmann, J.P. ; Zhan, Q. ; Andrews, R.J.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems II.  pp.256-265,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5392