Wang, J. ; Sciortino, P. ; Liu, P. ; Deng, X. ; Walters, F. ; Liu, X. ; Bacon, J. ; Chen, L.
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Nanoengineering: fabrication, properties, optics, and devices II : 3-4 August, 2005, San Diego, California. pp.59310D-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Wang, J. ; Deng, X. ; Sciortino, P. ; Varghese, R. ; Nikolov, A. ; Liu, F. ; Chen, L.
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Nanoengineering: fabrication, properties, optics, and devices II : 3-4 August, 2005, San Diego, California. pp.59310C-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China. pp.49-56, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, J. ; Deng, X. ; Liu, X ; Nikolov, A ; Sciortino, P ; Liu, F ; Chen, L
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Integrated Optics: Devices, Materials, and Technologies X. pp.61230P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Deng, X. ; Wang, J. ; Liu, F. ; Sciortino, F. P. ; Liu, X. Jr., ; Graham, A.
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Nanostructure Integration Techniques for Manufacturable Devices, Circuits, and Systems: Interfaces, Interconnects, and Nanosystems. pp.60030X-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering