1.

Conference Proceedings
Conference Proceedings
1. On the mechanism of the Smart CutTM layer transfer in relaxed SiGe
Nguyen, P. ; Aulnette, C. ; Guiot, E. ; Daval, N. ; Bourdelle K.K. ; Cayrefourcq, I. ; Deguet, C. ; Sartori, S. ; Tauzin, A. ; Lagahe-Blanchard, C. ; Soubie, A.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.185-190,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03
2.

Conference Proceedings
Conference Proceedings
2. Ge pile-up and defect formation during dry oxidation of SiGe
Daval, N. ; Guiot, E. ; Bourdelle, K. K. ; Kennard, M. ; Cayrefourcq, I. ; Akatsu, T. ; Mazure, C. ; Cerva, H. ; Rucki, A.
Pub. info.: Crystalline defects and contamination: their impact and control in device manufacturing IV : DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France.  pp.42-51,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-10
3.

Conference Proceedings
Conference Proceedings
3. (19.1) 1:10 - 1:30 PM - SiGe Wet Oxidation at Low Temperatures
Daval, N. ; Guiot, E. ; Bisson, S. ; Cayrefourcq, I. ; Bourdelle, K. K. (SOITEC)
Pub. info.: SiGe: materials, processing, and devices : proceedings of the First international symposium.  pp.1115-1122,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-07