1.

Conference Proceedings
Conference Proceedings
1. Channel Width, Length and Thickness Effects in LOCOS-Isolated SOT MOSFETs
Pretet, I. ; Cristoloveanu, S. ; Alliben, F. ; Zaslavsky, A. ; Raynaud, C.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.221-226,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
2.

Conference Proceedings
Conference Proceedings
2. Meta-stable dip (MSD) effect in fully-depleted SOI CMOSFETs
Bawedin, M. ; Yun, J.G. ; Cristoloveanu, S. ; Lee, H.D. ; Raynaud, C. ; Flandre, D.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.51-56,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03