Device Testing and SEM Testing Tools
- Author(s):
- Publication title:
- Testing and diagnosis of VLSI and ULSI
- Title of ser.:
- NATO ASI series. Series E, Applied sciences
- Ser. no.:
- 151
- Pub. Year:
- 1988
- Page(from):
- 469
- Page(to):
- 508
- Pages:
- 40
- Pub. info.:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9789024737949 [902473794X]
- Language:
- English
- Call no.:
- N11482/151
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
The DRPM Processing Platform Simulator: A Tool for Early Application Behaviour Tests and System Integration Analysis
ESA Communications |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Microsystem design framework based on tool adaptations and library developments
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
THERMODEL:a tool for thermal model generation and application for MEMS packages
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
10
Conference Proceedings
A new SEM/FIB crossbeam inspection tool for high-resolution materials and device characterization
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Design of an APS CMOS image sensor for space applications using standard CAD tools and CMOS technology
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Electron Backscatter Diffraction: A Powerful Tool for Phase Identification in the SEM
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Springer-Verlag |