1.

Conference Proceedings
Conference Proceedings
1. Investigation of salicide processes for thin film SOI microwave applications
Chen, J. ; Colinge, J.P. ; Flandre, D. ; Gillon, R. ; Raskin, J.P. ; Vanhoenacker, D.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.98-103,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
2.

Conference Proceedings
Conference Proceedings
2. Self-Consistent Simulation of Nano Scale SOT Devices: The Case of Nano Flash Memory
Tang, X. ; Baje, X. ; Colinge, J.P. ; Van de Wide, F. ; Bayor, V.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.409-414,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
3.

Conference Proceedings
Conference Proceedings
3. Effect of Quantum Confinement in SOI Single-Hole Transistors
Tang, X. ; Baje, X. ; Colinge, J.P. ; Van de Wiele, F. ; Bayot, V.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.415-420,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
4.

Conference Proceedings
Conference Proceedings
4. Performance of Double-Gate SOI nMOSFETs at Low Temperature
Vandooren, A. ; Cristoloveanu, S. ; Colinge, J.P. ; Flandre, D.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.427-432,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
5.

Conference Proceedings
Conference Proceedings
5. Characterization of SOI MOSFETs at microwave frequencies
Gillon, R. ; Raskin, J.P. ; Vanhoenacker, D. ; Colinge, J.P. ; Dambrine, G.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.149-154,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
6.

Conference Proceedings
Conference Proceedings
6. Gate-All-Around Technology for Harsh Environment Applications
Colinge, J.P.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.167-188,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58
7.

Conference Proceedings
Conference Proceedings
7. Nature of high-temperature charge instability of fully depleted SOI MOSFETs
Nazarov, A.N. ; Lysenko, V.S. ; Colinge, J.P. ; Flandre, D.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.455-460,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
8.

Conference Proceedings
Conference Proceedings
8. On the evolution of SOI materials and devices
Colinge, J.P.
Pub. info.: Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment.  pp.11-26,  2005.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 185