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Measurements of Proton Upset Induced in CMOS Devices: Synthesis of CEA Studies

Author(s):
Mijuin, D.
Buisson, J.
Chapuis, T.
Brunet, J.P.
Murat, J.
Milleret, G.
1 more
Publication title:
Proceedings of the ESA Electronic Components Conference, held at the Conference Centre, ESTEC, Noordwijk, the Netherlands, 12-16 November 1990
Title of ser.:
ESA SP
Ser. no.:
313
Pub. Year:
1991
Page(from):
419
Page(to):
426
Pages:
8
Pub. info.:
Paris: ESA Publications Division
ISSN:
03796566
ISBN:
9789290920946 [9290920947]
Language:
English
Call no.:
E11690/911401
Type:
Conference Proceedings

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