Electrical and structural properties of grain boundary in polycrystalline Si
- Author(s):
- Young, R.T. ( Solid State Divison, Oak Ridge National Laboratory )
- Narayan, J. ( Solid State Divison, Oak Ridge National Laboratory )
- Chang, Y.K. ( Solid State Divison, Oak Ridge National Laboratory )
- Publication title:
- Grain boundaries in semiconductors : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposia proceedings
- Ser. no.:
- 5
- Pub. Year:
- 1982
- Page(from):
- 111
- Page(to):
- 117
- Pub. info.:
- New York: North-Holland
- ISSN:
- 02729172
- ISBN:
- 9780444006974 [0444006974]
- Language:
- English
- Call no.:
- M23500/5
- Type:
- Conference Proceedings
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