Optical design and testing : 15-18 October 2002, Shanghai, China. pp.139-145, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Liu, L. ; Chang, B.K. ; Li, W. ; Qian, Y.S. ; Fu, R.G. ; Zhong, Z.Y.
Pub. info.:
Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. pp.332-338, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering