Chang, B. ; Du, X. ; Liu, L. ; Zong, Z. ; Fu, R. ; Qian, Y.
Pub. info.:
Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA. pp.209-218, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Electro-optical system design, simulation, testing, and training : 9-10 July 2002, Seattle, Washington, USA. pp.129-135, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Novel optical systems design and optimization VI : 4 August 2003, San Diego, California, USA. pp.210-217, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China. pp.339-344, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Low-light-level and real-time imaging systems, components, and applications :9-11 July 2002, Seattle, Washington, USA. pp.100-106, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chang, B. ; Fu, R. ; Zong, Z. ; Qian, Y. ; Zhan, Q. ; Gao, P. ; Du, X. ; Liu, L.
Pub. info.:
Low-light-level and real-time imaging systems, components, and applications :9-11 July 2002, Seattle, Washington, USA. pp.33-40, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor and Organic Optoelectronic Materials and Devices. pp.542-547, 2000. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering