High-resolution extended NIR camera

High-resolution extended NIR camera

Author(s):

Cabelli, S.A. ( Rockwell Scientific Co. (USA) )

Pan, J. ( Rockwell Scientific Co. (USA) )

Bernd, S.G. ( Rockwell Scientific Co. (USA) )

Tennant, W.E. ( Rockwell Scientific Co. (USA) )

Blackwell, J.D. ( Rockwell Scientific Co. (USA) )

Bhargava, S. ( Rockwell Scientific Co. (USA) )

Pasko, J.G. ( Rockwell Scientific Co. (USA) )

Piquette, E.C. ( Rockwell Scientific Co. (USA) )

Edwall, D.D. ( Rockwell Scientific Co. (USA) )

4 more

Publication title:

Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5074

Pub. Year:

2003

Page(from):

343

Page(to):

352

Pages:

10

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449337 [0819449334]

Language:

English

Call no.:

P63600/5074

Type:

Conference Proceedings

Details

TDL ID:	ZA00013062
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Infrared Technology and Applications
Conf. info. (Number):	2003 : 29th
Conf. info. (Venue):	Oriando, FL, USA
Conf. info. (Date):	2003.04.21-2003.04.25

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