1.

Technical Paper
Technical Paper
1. EFFICIENT CHIP SIGNATURE CHECKING FOR DIAGNOSING BOUNDARY SCAN SYSTEMS
LUBASZEWSKI, M. ; CASTRO-ALVES, V. ; NICOLAIDIS, M. ; COURTOIS, B.
Pub. info.: NASA Technical Reports.  pp.1-22,  1992.  National Aeronautics and Space Adminstration
2.

Technical Paper
Technical Paper
2. BUILT-IN GENERATION FOR CMOS CIRCUITS
DARLAY, F. ; BASCHIERA, D. ; COURTOIS, B.
Pub. info.: NASA Technical Reports.  pp.1-28,  1988.  National Aeronautics and Space Adminstration
3.

Technical Paper
Technical Paper
3. BULLT IN TEST OF FOLDED PLAS
FERNANDES, A.O. ; COURTOIS, B.
Pub. info.: NASA Technical Reports.  pp.1-25,  1988.  National Aeronautics and Space Adminstration
4.

Technical Paper
Technical Paper
4. B2UBIST: A STRAREGY FOR BOUNDARY SCAN BOARD UNIFIED BIST
LUBASZEWSKI, M. ; COURTOIS, B.
Pub. info.: NASA Technical Reports.  pp.1-19,  1991.  National Aeronautics and Space Adminstration