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11 results

Conference Proceedings

1. DISTRIBUTION OF MISFIT DISLOCATIONS IN SiGe ON Si MEASURED WITH SYNCHROTRON-RADIATION TOPOGRAPHY

Capano, M. A. ; Hobbs, L. W. ; Hart, L. ; Gordon-Smith, D. ; Bowen, D. K. ; Thomas, C. R.

Pub. info.:	Heteroepitaxy of dissimilar materials : symposium held April 29-May 2, 1991, Anaheim, California, U.S.A.. pp.363-368, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	221

Conference Proceedings

2. GRAZING INCIDENCE X-RAY REFLECTOMETRY STUDIES OF CADMIUM ARACHIDATE LANGMUIR-BLODGETT FILMS

Tanner, B. K. ; Bowen, D. K. ; Petty, M. C. ; Swaminathan, S. ; Grunfeld, F.

Pub. info.:	Interface dynamics and growth : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.. pp.281-286, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	237

Conference Proceedings

3. PRINCIPLES AND PERFORMANCE OF A PC-BASED PROGRAM FOR SIMULATION OF GRAZING INCIDENCE X-RAY REFLECTIVITY PROFILES

Wormington, M. ; Bowen, D. K. ; Tanner, B. K.

Pub. info.:	Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.119-126, 1992. Pittsburgh. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	238

Conference Proceedings

4. THERMAL DEGRADATION OF SiGe INTERFACES STUDIED BY X-RAY REFLECTIVITY AND DIFFRACTION

Hudson, , J. M. ; Powell, A. R. ; Bowen, D. K. ; Wormington, M. ; Tanner, B. K. ; Kubiak, R. A. ; Parker, E. H. C.

Pub. info.:	Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.455-460, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	239

Conference Proceedings

5. CRYSTALLINITY OF ISOLATED SILICON EPITAXY (ISE) SILICON-ON-INSULATOR LAYERS

Allen, L. T. P. ; Zavrachy, P. M. ; Vu, D. P. ; Batty, M. W. ; Henderson, W. R. ; Boden T. J. ; Bowen, D. K. ; Gorden-Smith D. ; Thomas, C. R. ; Tjahjadi, T.

Pub. info.:	Chemistry and defects in semiconductor heterostructures. pp.409-414, 1989. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	148

Conference Proceedings

6. A GRAZING INCIDENCE X-RAY REFLECTOMETER FOR RAPID NONDESTRUCTIVE CHARACTERIZATION OF THIN FILMS AND INTERFACES

Loxley, N. ; Monteiro, A. ; Cooke, M. L.. ; Bowen, D. K. ; Tanner, B. K.

Pub. info.:	Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.219-224, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	240

Conference Proceedings

7. { 224 } PLANE X-RAY DIFFRACTION STUDY OF GaAs ON Si WAFER USING A CONVENTIONAL DOUBLE CRYSTAL DIFFRACTOMER

Lee, J. W. ; Bowen, D. K. ; Salerno, J. P.

Pub. info.:	Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A.. pp.193-200, 1987. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	91

Conference Proceedings

8. CHARACTERIZATION OF SUB-SURFACE STRUCTURES BY DOUBLE CRYSTAL X-RAY DIFFRACTION

Bowen, D. K. ; Hill, M. J. ; Tanner, B. K.

Pub. info.:	Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.. pp.447-454, 1987. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	82

Conference Proceedings

9. NEW ALGORITHMS FOR RAPID FULL-WAFER MAPPING BY HIGH RESOLUTION DOUBLE AXIS X-RAY DIFFRACTION

Loxley, N. ; Cockerton, S. ; Cooke, L. M. ; Gray, T. ; Tanner, B. K. ; Bowen, D. K.

Pub. info.:	Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.. pp.451-, 1994. Pittsburgh. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	324

10.

Conference Proceedings

10. Combined Room Temperature Photoluminescence and High Resolution X-ray Diffraction Mapping of Semiconductor Wafers

Cockerton, S. ; Cooke, M. L. ; Bowen, D. K. ; Tanner, B. K.

Pub. info.:	Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.555-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	406

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