1.

Conference Proceedings
Conference Proceedings
1. GRAZING INCIDENCE X-RAY REFLECTOMETRY STUDIES OF CADMIUM ARACHIDATE LANGMUIR-BLODGETT FILMS
Tanner, B. K. ; Bowen, D. K. ; Petty, M. C. ; Swaminathan, S. ; Grunfeld, F.
Pub. info.: Interface dynamics and growth : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.281-286,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 237
2.

Conference Proceedings
Conference Proceedings
2. PRINCIPLES AND PERFORMANCE OF A PC-BASED PROGRAM FOR SIMULATION OF GRAZING INCIDENCE X-RAY REFLECTIVITY PROFILES
Wormington, M. ; Bowen, D. K. ; Tanner, B. K.
Pub. info.: Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.119-126,  1992.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 238
3.

Conference Proceedings
Conference Proceedings
3. THERMAL DEGRADATION OF SiGe INTERFACES STUDIED BY X-RAY REFLECTIVITY AND DIFFRACTION
Hudson, , J. M. ; Powell, A. R. ; Bowen, D. K. ; Wormington, M. ; Tanner, B. K. ; Kubiak, R. A. ; Parker, E. H. C.
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.455-460,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239
4.

Conference Proceedings
Conference Proceedings
4. A GRAZING INCIDENCE X-RAY REFLECTOMETER FOR RAPID NONDESTRUCTIVE CHARACTERIZATION OF THIN FILMS AND INTERFACES
Loxley, N. ; Monteiro, A. ; Cooke, M. L.. ; Bowen, D. K. ; Tanner, B. K.
Pub. info.: Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.219-224,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 240
5.

Conference Proceedings
Conference Proceedings
5. CHARACTERIZATION OF SUB-SURFACE STRUCTURES BY DOUBLE CRYSTAL X-RAY DIFFRACTION
Bowen, D. K. ; Hill, M. J. ; Tanner, B. K.
Pub. info.: Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A..  pp.447-454,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 82
6.

Conference Proceedings
Conference Proceedings
6. NEW ALGORITHMS FOR RAPID FULL-WAFER MAPPING BY HIGH RESOLUTION DOUBLE AXIS X-RAY DIFFRACTION
Loxley, N. ; Cockerton, S. ; Cooke, L. M. ; Gray, T. ; Tanner, B. K. ; Bowen, D. K.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.451-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324
7.

Conference Proceedings
Conference Proceedings
7. Combined Room Temperature Photoluminescence and High Resolution X-ray Diffraction Mapping of Semiconductor Wafers
Cockerton, S. ; Cooke, M. L. ; Bowen, D. K. ; Tanner, B. K.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.555-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
8.

Conference Proceedings
Conference Proceedings
8. GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE
Wormington, M. ; Sakurai, K. ; Bowen, D. K. ; Tanner, B. K.
Pub. info.: Determining nanoscale physical properties of materials by microscopy and spectroscopy.  pp.525-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 332