Blank Cover Image

DIELECTRIC METROLOGY VIA MICROWAVE TOMOGRAPHY:PRESENT AND FUTURE

Author(s):
Publication title:
Microwave processing of materials IV : symposium held April 4-8, 1994, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
347
Pub. Year:
1994
Page(from):
259
Pub. info.:
Pittsburgh,, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992474 [1558992472]
Language:
English
Call no.:
M23500/347
Type:
Conference Proceedings

Similar Items:

Bolomey, J. Ch.

ESA Publications Division

Bolomey, J. Ch., Cottard, G., Berthaud, P., Lemaitre, A., Portala, J. F.

MRS - Materials Research Society

Bolomey, J. Ch.

MRS - Materials Research Society

Glindemann, A., Albertsen, M., Andolfato, L., Avila, G., Ballester, P., Bauvir, B., Delplancke, F., Derie, F., Dimmler, …

SPIE - The International Society of Optical Engineering

Bolomey, J. Ch., Pichot, Ch.

Materials Research Society

Oda, Steven J.

Materials Research Society

Bolomey, J. Ch., Cottard, Cown, B. J.

Materials Research Society

Caber,P.J., Olszak,A.G., Ragan,C., Aziz,D.J.

SPIE-The International Society for Optical Engineering

Joisel,A., Bolomey,J.-C.

SPIE - The International Society for Optical Engineering

Jiang, J.

SPIE-The International Society for Optical Engineering

N.H. Abramson

Society of Photo-optical Instrumentation Engineers

Chabinsky, Irving J.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12