X-RAY DIFFRACTION AND SIMS STUDIES OF MBE GROWN DOPING SUPERLATTICES IN SILICON
- Author(s):
- Publication title:
- Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 102
- Pub. Year:
- 1988
- Page(from):
- 289
- Page(to):
- 294
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837708 [0931837707]
- Language:
- English
- Call no.:
- M23500/102
- Type:
- Conference Proceedings
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