1.

Conference Proceedings
Conference Proceedings
1. Defect creation mechanisms due to hot-carriers in 0.15 μm SIMOX MOSFETs
Dimitrakis, P. ; Jomaah, J. ; Balestra, F. ; Papaioannou, G.J.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.263-268,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58
2.

Conference Proceedings
Conference Proceedings
2. Analysis and modeling of self-heating effects in thin-film SOI MOSFET's as a function of temperature
Jomaah, J. ; Balestra, F. ; Ghibaudo, G.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.296-303,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
3.

Conference Proceedings
Conference Proceedings
3. Reliability and electrical fluctuations in advanced SOI CMOS devices
Jomaah, J. ; Balestra, F.
Pub. info.: Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment.  pp.109-120,  2005.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 185
4.

Conference Proceedings
Conference Proceedings
4. Temperature Dependence of Gate-Induced-Drain-Leakage (GIDL) Current in Thin-Film SOl MOSFETs
Jomaah, J. ; Ghibaudo, G. ; Balestra, F.
Pub. info.: Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.260-270,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-9
5.

Conference Proceedings
Conference Proceedings
5. An overview of low-frequency noise in advanced CMOS/SOI transistors (Invited Paper)
Jomaah, J. ; Balestra, F.
Pub. info.: Noise in Devices and Circuits.  pp.159-167,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113