Blank Cover Image

Image simulation for photoelectric imaging system

Author(s):
Publication title:
Process Control and Inspection for Industry
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4222
Pub. Year:
2000
Page(from):
105
Page(to):
109
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437945 [0819437948]
Language:
English
Call no.:
P63600/4222
Type:
Conference Proceedings

Similar Items:

Bai,T., Li,N., Zou,Z., Lu,H., Yan,G.

SPIE-The International Society for Optical Engineering

X. Zhang, T. Bai, H. Li

Society of Photo-optical Instrumentation Engineers

L. Zou, W. Gao, T. Wu, Q. Lu, Y. Zhang

Society of Photo-optical Instrumentation Engineers

Gao,X., Wang,L.

SPIE-The International Society for Optical Engineering

Liu,W., Bai,F., Zhao,T., Chen,L., Li,Y.

SPIE-The International Society for Optical Engineering

H. Li, X. Wang, T. Bai, W. Jin, Y. Huang

Society of Photo-optical Instrumentation Engineers

Yang,Y., Lu,Z., Liu,Y., Zhou,H., Gao,H.

SPIE-The International Society for Optical Engineering

Y. Zhang, K. Gao, G. Ni, T. Bai

Society of Photo-optical Instrumentation Engineers

Bai, L., Sun, S., Xu, R., Zhang, B.

SPIE-The International Society for Optical Engineering

G. Cheng, S. Cai, H. Gao, S. Zhang, Y. Qiao

Society of Photo-optical Instrumentation Engineers

Wang, X., Jin,W., Gao,Z., Wang,Z., Bai, T.

SPIE - The International Society of Optical Engineering

Lui L., Qian Y., Li Y.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12