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61 results

Conference Proceedings

1. Integral imaging with variable image planes using polymer-dispersed liquid crystal layers

Y. Kim ; H. Choi ; J. Kim ; S.-W. Cho ; B. Lee

Pub. info.:	Three-dimensional TV, video, and display V : 3-4 October, 2006, Boston, Massachusetts, USA. 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6392

Conference Proceedings

2. Integral floating 3D display system: principle and analysis

B. Lee ; J. Kim ; S.-W. Min

Pub. info.:	Three-dimensional TV, video, and display V : 3-4 October, 2006, Boston, Massachusetts, USA. 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6392

Conference Proceedings

3. A thin 3D-2D convertible integral imaging system with a pinhole array on a polarizer

H. Choi ; Y. Kim ; S. Cho ; J. Kim ; B. Lee

Pub. info.:	Three-dimensional TV, video, and display V : 3-4 October, 2006, Boston, Massachusetts, USA. 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6392

Conference Proceedings

4. Failure Mechanism by Organic Contaminants in Si Device Fabrication

K. Kim ; J. Kim ; K. Lee ; H. Kang ; B. Lee

Pub. info.:	High Purity Silicon 10. pp.227-236, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(6)

Conference Proceedings

5. Alkaline Hydroxide Induced High Level of Alkali Metal Concentration Effect on the Characteristics of LTO Layer

J. Kim ; W. Seo ; W. Lee ; D. Hwang ; B. Lee

Pub. info.:	Physical, Analytical, and Spectro-Electrochemistry (General) - 214th ECS Meeting/PRiME 2008. pp.37-42, 2009. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(28)

Conference Proceedings

6. Influences of Gate Recess Structure on the DC Characteristics of 0.1 Micron Metamorphic HEMTs

J. Oh ; Y. Back ; S. Choi ; S. Moon ; B. Lee

Pub. info.:	State-of-the-Art Program on Compound Semiconductors XLIV. pp.71-77, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	2(5)

Conference Proceedings

7. Silicon Carbide Schottky Rectifiers with Improved Avalanche Ruggedness

A. Konstantinov ; S. Jinman ; S. Young ; B. Lee ; F. Allerstam

Pub. info.:	Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy. pp.777-781, 2016. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	858

Conference Proceedings

8. Defect Delineation by Electrochemical Cu Deposition in p-type Si Wafers

K. Kim ; H. Ham ; D. Hwang ; B. Lee

Pub. info.:	Analytical and diagnostic techniques for semiconductor materials, devices and processes 7. pp.213-217, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(3)

Conference Proceedings

9. Evaluation of Surface Defects in Silicon on Insulator using Modified HF Defects and Cu Decoration Method (HCM)

E. Lee ; K. Lee ; D. Hwang ; B. Lee

Pub. info.:	Analytical and diagnostic techniques for semiconductor materials, devices and processes 7. pp.207-212, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(3)

10.

Conference Proceedings

10. Charge Trapping Effects in High-k Transistors

C. Bersuker ; J. Sim ; C. Young ; R. Choi ; C. Park ; B. Lee

Pub. info.:	Physics and technology of high-k gate dielectrics III. pp.663-670, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(5)

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