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Experimental verification of improved printability for litho-driven designs [6156-25]

Author(s):
Van Wingerden, J. ( Philips Research Europe (Belgium) )
Le Cam, L. ( Philips Semiconductors (France) )
Wientjes, R. ( Philips Semiconductors CTO (Netherlands) )
Benndorf, M. ( Philips Research Europe (Belgium) )
Trouiller, Y. ( CEA-LETI (France) )
Belledent. J. ( Philips Semiconductors (France) )
Morton, R. ( Philips Semiconductors (France) )
Aksenov, Y. ( Philips Research Europe (Belgium) )
3 more
Publication title:
Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6156
Pub. Year:
2006
Page(from):
61560O
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461995 [0819461997]
Language:
English
Call no.:
P63600/6156
Type:
Conference Proceedings

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