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Conference Proceedings

1. Injection-Level Spectroscopy of Metal Impurities in Silicon

Ahrenkiel, R. K. ; Johnston, S.

Pub. info.:	Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.575-, 1998. Warrendale, Pa. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	510

Conference Proceedings

2. Measurement of the Temperature Dependence of Silicon Recombination Lifetimes

Johnston, S. ; Ahrenkiel, R. K.

Pub. info.:	Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.607-, 1998. Warrendale, Pa. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	510