1.

Conference Proceedings

Conference Proceedings
Siegie,H. ; Kaschner,A. ; Loa,I. ; Thurian,P. ; Hoffmann,A. ; Broser,I. ; Thomsen,C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1197-1202,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Hoffmann,A. ; Podlowski,L. ; Thurian,P. ; Heitz,R. ; Broser,I.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.411-416,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings

Conference Proceedings
Thurian,P. ; Heitz,R. ; Kleinwachter,S. ; Hoffmann,A. ; Broser,I.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.453-458,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
4.

Conference Proceedings

Conference Proceedings
Thurian,P. ; Kaczmarczyk,G. ; Siegle,H. ; Heitz,R. ; Hoffmann,A. ; Broser,I. ; Meyer,B.K. ; Hoffbauer,R. ; Scherz,U.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1571-1576,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings

Conference Proceedings
Telahun,T. ; Thurian,P. ; Hoffmann,A. ; Broser,I. ; Scherz,U.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.767-772,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings

Conference Proceedings
Heitz,R. ; Thurian,P. ; Loa,I. ; Eckey,L. ; Hoffmann,A. ; Broser,I. ; Pressel,K. ; Meyer,B.K. ; Mokhov,E.N.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.719-724,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201