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8 results

1.

Conference Proceedings

1. Zeeman Spectroscopy of Transition Metals in Hexagonal GaN

Heitz,R. ; Thurian,P. ; Loa,I. ; Eckey,L. ; Hoffmann,A. ; Broser,I. ; Pressel,K. ; Meyer,B.K. ; Mokhov,E.N.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.719-724, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

2.

Conference Proceedings

2. Photoluminescence Uniaxial Stress Study of Fe2+ in InP

Thonke,K. ; Pressel,K. ; Hermann,H.U. ; Domen,A.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part2 pp.869-874, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

3.

Conference Proceedings

3. Optical investigation of Ge-rich Ge1-xSix(o｡蛉｡？.1)alloys

Franz,M. ; Pressel,K. ; Dombrowski,K.F. ; Rucker,H. ; Barz,A. ; Dold,P. ; Benz,K.W.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.109-114, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

4.

Conference Proceedings

4. Zeeman study of the 0.94 eV emission in AlN and GaN

Thurian,P. ; Loa,I. ; Maxim,P. ; Pressel,K. ; Hoffmann,A. ; Thomsen,C.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1131-1136, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

5.

Conference Proceedings

5. Shallow Bound Pseudoacceptor States of Iron in Gallium Phosphide

Ddrnen,A. ; Pressel,K. ; Ruckert,G. ; Thonke,K.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.2 pp.791-796, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

6.

Conference Proceedings

6. An Optical Zeeman Study on Fe3+ in GaAs and InP

Kaufmann,B. ; Haase,D. ; Dornen,A. ; Hiller,C. ; Pressel,K.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.2 pp.797-802, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

7.

Conference Proceedings

7. Ni Related Centers in Synthetic Diamond

Hofmann,D.M. ; Christmann,P. ; Volm,D. ; Pressel,K. ; Pereira,L. ; Santos,L. ; Pereira,E.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.79-84, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

8.

Conference Proceedings

8. FTIR high resolution optical study of GaAs:Fe

Pressel,K. ; Ruckert,G. ; Thonke,K. ; Dornen,A.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.2 pp.695-700, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

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