1.

Conference Proceedings
Conference Proceedings
1. Improvement of Polysilicon Thin Films and Thin-Film Transistors Using Ultrasound Treatment
Ostapenko, S. ; Jastrzebski, L. ; Lagowski, J. ; Smeltzer, R. K.
Pub. info.: Flat panel display materials II : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.201-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 424
2.

Conference Proceedings
Conference Proceedings
2. Analysis of Hydrogenation in Thin Film Polycrystalline Silicon Using Surface Photovoltage Measurement Technique
Henley, W. ; Ostepenko, S. ; Karimpanakkel, S. ; Jastrzebski, L. ; Lagowski, J.
Pub. info.: Proceedings of the Second Symposium on Thin Film Transistor Technologies.  pp.265-268,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-35
3.

Conference Proceedings
Conference Proceedings
3. Surface Photovoltage Characterization of Low Temperature Annealed LPCVD Silicon on Glass
Sen, S. ; Hoff, A.M. ; Moradi, B. ; Lagowski, J. ; Jastrzebski, L.
Pub. info.: Proceedings of the Second Symposium on Thin Film Transistor Technologies.  pp.269-278,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-35
4.

Conference Proceedings
Conference Proceedings
4. Whole-Wafer Plasma Damage Evaluation
Hoff, A.M. ; Lagowski, J. ; Nauka, N. ; Esry, T.C. ; Edelman, P. ; Jastrzebski, L.
Pub. info.: Proceedings of the Fourth International Symposium on High Purity Silicon.  pp.544-553,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-13
5.

Conference Proceedings
Conference Proceedings
5. Enhanced Hydrogenation of Interface Bulk and Surface Traps in Polycrystalline Silicon Thin Films Subjected to Ultrasound Treatment
Ostapenko, S. ; Karimpanakkel, S. ; Jastrzebski, L. ; Lagowski, J.
Pub. info.: Proceedings of the Second Symposium on Thin Film Transistor Technologies.  pp.61-67,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-35
6.

Conference Proceedings
Conference Proceedings
6. EFFECTS OF RESIDUAL IRON CONTAMINATION INTRODUCED DURING WET CHEMICAL PROCESSING ON THIN OXIDE BREAKDOWN AND RELIABILITY CHARACTERISTICS
Henley, W.B. ; Jastrzebski, L. ; Haddad, N.F.
Pub. info.: Proceedings of the Third International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.487-494,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-7
7.

Conference Proceedings
Conference Proceedings
7. HEAVY METAL AND ORGANIC CLEANING EFFICIENCY OPTIMIZATION AND MONITORING FOR REAL-TIME, IN-LINE PROCESS CONTROL BY SURFACE PHOTOVOLTAGE
Jastrzebski, L. ; Henley, W. ; DeBusk, D. ; Haddad, N. ; Lowell, J. ; Wenner, V. ; Nauka, K. ; Persson, E.
Pub. info.: Proceedings of the Third International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.530-536,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-7
8.

Conference Proceedings
Conference Proceedings
8. Effect of Metal Underlayer on Plasma Induced Charging
Karzhavin, Y. ; Wu, W. ; Findlay, A. ; Jastrzebski, L.
Pub. info.: Proceedings of the International Symposium on Thin Film Materials, Processes, Reliability, and Applications, Thin Film Processes.  pp.183-194,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-30
9.

Conference Proceedings
Conference Proceedings
9. MONITORING SIMOX LAYER PROPERTIES AND IMPLANTATION TEMPERATURE BY OPTICAL MEASUREMENTS
Harbeke, G. ; Steigneier, E. F. ; Hemment, P. L. F. ; Reeson, K. J. ; Jastrzebski, L.
Pub. info.: Silicon-on-insulator and buried metals in semiconductors : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.133-136,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 107
10.

Conference Proceedings
Conference Proceedings
10. *S0I NY CVD: AN OVERVIEW OF MATERIAL ASPECTS AND IMPLICATIONS OF DEVICE PROPERTIES
Jastrzebski, L. ; Kokkas, A. G.
Pub. info.: Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A..  pp.417-430,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 23